Enhancing Performance, Quality and Yield in Current and Emerging Display Technologies

Process metrology, failure analysis, and core-structure characterization can be invaluable in accelerating research and development, enhancing yield and improving display quality.

Controlling Polymers to Tune TFTs

Thin-film transistors (TFT) created using only additive process steps could create new low-cost ICs with functionalities beyond silicon, but only if we understand how to control structures at the molecular level. Thin films of conjugated polymers such as poly(3-hexylthiophene) (P3HT)…

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