EV Group (EVG), a supplier of wafer bonding and lithography equipment, today announced that it has partnered with Ningbo Semiconductor International Corporation (NSI), a specialty semiconductor foundry based in Ningbo, China, in the development of the industry’s first process technology…
Intel surpasses Samsung in semiconductor sales revenue in Q4 2018
Samsung maintains number one ranking in semiconductor sales for the total year 2018. The declining market for semiconductors used in mobile handsets and enterprise servers led to a realignment in the company market-share ranking for semiconductor manufacturers. While Samsung led…
MACOM and GLOBALFOUNDRIES collaborate to scale silicon photonics to hyperscale cloud Data Center and 5G network buildouts
Production scale of 300mm wafers is expected to enable exponential port growth in cloud Data Centers and 5G networks. MACOM Technology Solutions Inc. and GLOBALFOUNDRIES announced a strategic collaboration to ramp MACOM’s innovative Laser Photonic Integrated Circuit (L-PIC™) platform using…
Intel announces tweaks to 22FFL process for RF, MRAM at IEDM18
Part 2 – MRAM in 22FFL The second 22FFL paper at IEDM18 [1] describes the integration of Magnetic Tunnel Junction (MTJ)-based MRAM (magnetic random-access memory) into the back-end of the process. MTJ technology is attractive for embedded non-volatile memory because…
Intel announces tweaks to 22FFL process for RF, MRAM at IEDM18
At IEDM last year, Intel gave a half-dozen papers on various topics, including two on their 22FFL SoC process aimed at low power IoT and mobile products. The first (14.1) was an invited presentation on “Intel 22nm FinFET (22FFL) Process…
Process Watch: Monitoring for Excursions in Automotive Fabs
By David W. Price, Jay Rathert and Douglas G. Sutherland Author’s Note: The Process Watch series explores key concepts about process control—defect inspection, metrology and data analytics—for the semiconductor industry. This article is the fourth in a series on process…
Process Watch: Automotive Defect Sensitivity Requirements
By David W. Price, Douglas G. Sutherland, Jay Rathert, John McCormack and Barry Saville Author’s Note: The Process Watch series explores key concepts about process control—defect inspection, metrology and data analytics—for the semiconductor industry. This article is the third in…
The First Degree – Ominous Threshold Reached
In light of the Paris climate talks going on this week, I’m delighted to turn this blog over to a guest blogger, Mike Czerniak. Mike is the Environmental Solutions Business Development Manager at Edwards, and has been working in the semiconductor industry for more than 30 years.
