Nordson Test & Inspection will unveil the new Quadra 7 Pro Manual X-Ray Inspection (MXI) system at SEMICON China.
The role of cryogenic wafer probing in applications such as cryogenic quantum computing and supra-conductive CMOS semiconductors, where temperatures near absolute zero are essential, is discussed.
A method of measurement is described that provides the necessary feedback to correctly evaluate laser diode and driver performance and changes in spectral response with temperature simultaneously.
Nearly every new technology breakthrough in the semiconductor industry targets high volume manufacturing and comes with its unique specificities. This results in challenges for engineers to manufacture and test new integrated circuits (ICs) on the wafer.