LiDAR Laser Circuit Optimization and Measurement

A method of measurement is described that provides the necessary feedback to correctly evaluate laser diode and driver performance and changes in spectral response with temperature simultaneously.

Revolutionizing Wafer Testing to Bring New Technologies to Market

Nearly every new technology breakthrough in the semiconductor industry targets high volume manufacturing and comes with its unique specificities. This results in challenges for engineers to manufacture and test new integrated circuits (ICs) on the wafer.