A team led by researchers at the University of Warwick have discovered a breakthrough in how to measure the electronic structures of stacked 2D semiconductors using the photoelectric (PE) effect. Materials scientists around the world have been investigating various heterostructures…
Chasing IC Yield when Every Atom Counts
Increasing fab costs coming for inspection and metrology At SEMICON West this year in Thursday morning’s Yield Breakfast sponsored by Entegris, top executives from Qualcomm, GlobalFoundries, and Applied Materials discussed the challenges to achieving profitable fab yield for atomic-scale devices…
