NIMS and AIST have developed a small sensor capable of continuously monitoring the plant hormone ethylene. Ethylene gas promotes ripening in fruits and vegetables, but excessive exposure promotes them to rot. The new small sensor can be used to monitor fruits and vegetables by continuously detecting ethylene gas, ensuring the freshness during transportation and storage, and helping reduce food waste.
Park Systems Announces Online Special Edition “NanoScientific Symposium on Nano Applications for Today’s Changing World”
Park Systems presents “NanoScientific Symposium on Nano Applications for a Changing World” sponsored by Physics World and Nanotechnology World Association. Park Systems launched this online event for researchers and scientists in nanoscience and nanotechnology to share data on how new nano applications under research will lead to discoveries that have a tremendous positive impact on the world.
Taiwan Edges South Korea as Largest Base for IC Wafer Capacity
China capacity expansion forecast to push the country into second place in the regional rankings in 2022, trailing only Taiwan in size.
Pfeiffer Vacuum Introduces OmniStar and ThermoStar Next Generation Gas Analyzers
OmniStar and ThermoStar GSD 350 are compact, portable benchtop analyzers for analyzing gases at atmospheric pressure.
STMicroelectronics Extends USB Fast Charging over USB-C to Embedded Applications with USB-IF-Certified Development Board
STMicroelectronics (NYSE: STM), a global semiconductor leader serving customers across the spectrum of electronics applications, is facilitating modernization of battery-powered products to capture the advantages of the latest USB Power Delivery (USB PD) technology including faster charging and easy reuse of USB-C chargers and cables.
ASMC 2020 to Go Virtual with Latest Insights in Advanced Semiconductor Manufacturing
Industry leaders and visionaries will gather in virtual format August 24-26, 2020, for the SEMI Advanced Semiconductor Manufacturing Conference (ASMC) to provide the latest insights and developments across a wide range of critical industry topics from yield management to metrology in the era of artificial intelligence (AI).
