Shannon Davis

News and Web Editor

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Shannon, writes, edits and produces Semiconductor Digest’s news articles, email newsletters, blogs, webcasts, and social media posts. She holds a bachelor’s degree in journalism from Huntington University in Huntington, IN. In addition to her years of freelance business reporting, Shannon has also worked in marketing and public relations in the renewable energy and healthcare industries.

Archer Demonstrates Cryogenic TMR Sensor Functionality for Potential Use Across Quantum Computing Platforms

Archer Materials Limited announces the successful demonstration of highly sensitive magnetic field measurements at cryogenic temperatures using TMR sensors.

Nordson Test & Inspection Expands Partnership with Distributor smartTec Nordic A/S

Nordson Test & Inspection today announced that smartTec will expand distribution of X-Ray and Test Solutions to include Denmark, Norway, Finland, Sweden, Latvia, Lithuania and Estonia.

Polymatech Electronics Appoints Allen Nejah as Chief Innovation Officer and Head of New Product Development

Polymatech Electronics, India’s pioneering semiconductor company headquartered in Chennai, announced the appointment of Allen Nejah as Chief Innovation Officer and Head of New Product Development. 

Materion Completes Acquisition to Expand Semiconductor Footprint and Capabilities in Asia

Materion reported today that it has completed its previously announced acquisition of manufacturing assets for tantalum solutions in Dangjin City, South Korea, serving the semiconductor market.

First Look at Defects in Single-Crystal Indium Gallium Zinc Oxide Could Fix Persistent Display Instability

Insights into atomic-scale defects may enable next-generation thin-film transistors for smartphones, televisions, and flexible electronics.

Semiconductors Show Promise for Efficient Carbon Capture and Utilization

Innovative catalyst design enables the selective conversion of carbon dioxide into methanol.

JEDEC Releases New LPDDR6 Standard to Enhance Mobile and AI Memory Performance

JEDEC Solid State Technology Association today announced the publication of JESD209-6, the latest Low Power Double Data Rate 6 (LPDDR6) standard.

New Microtronic WaferWeight Monitors Semiconductor Wafer Mass During Macro Defect Inspection

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as defects are being inspected – all on a single tool.

Opening Doors to Smaller, Smarter Devices

Researchers at the University of California, Riverside, have uncovered how to manipulate electrical flow through crystalline silicon, a material at the heart of modern technology.

SK hynix Adopts Infinitesima 3D Metrology Tool for Volume DRAM Production

Infinitesima today announced that SK hynix, a full stack artificial intelligence (AI) memory provider, has adopted the Metron3D 300mm in-line wafer metrology system and released it for use in volume production.