Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced the receipt of a significant order from a tier-1 semiconductor manufacturer in Korea for a wafer-level magnetic tester. Hprobe also announced signing with Woowon Technology for representation and distribution in the Korean market. This announcement furthers Hprobe’s market penetration strategy of strong local support in key markets.
Hprobe’s IBEX tester is clearly recognized as an essential solution for the memory industry. The company’s expansion into the all-important Korean market is confirmed with this first order and the signing of a proven sales partner.
“This purchase by a world-famous semiconductor company in Korea confirms the uniqueness of our technology and highlights the critical role we’ll play in enabling mass production of magnetic devices,” said Laurent Lebrun, CEO of Hprobe. “Additionally, we have chosen Woowon, which has an excellent track record representing well-known international semiconductor equipment companies. Woowon is the right partner to grow our market share in Korea through their strong local network and support.”
Woowon Technology, a key representative and distributor in the Korean semiconductor market for over 30 major foreign manufacturers will distribute Hprobe’s unique ATE equipment.“Korea has gained a reputation as the world’s biggest memory chip provider. We believe Hprobe is a great fit for our customers in Korea and we are delighted about this partnership,”said Dr. Hwan W. Oh, CEO of Woowon Technology. “Hprobe’s magnetic testers and unique expertise complement our growing portfolio, and we look forward to offering their innovative testing solutions to our customers.”
The Hprobe’s IBEX platform, which is compatible with 200mm and 300mm automated wafer probers, is dedicated to testing MRAM magnetic tunnel junctions, bit cells based on Spin Transfer Torque (STT-MRAM), Spin-Orbit Torque (SOT-MRAM), and Voltage Controlled (VC-MRAM) technologies. The system is capable of testing at high throughput, both under fast variable 3D magnetic field as well as with ultra-narrow pulsed signals. It contains unique proprietary technology for wafer-level testing and characterization of magnetic devices by means of electrical probing, while varying a 3D magnetic field above the device. By applying a very fast sweeping magnetic field in any direction of space, a fast and accurate electrical response is obtained for qualifying the device under test.
Woowon will be exhibiting and presenting Hprobe’s unique ATE product portfolio at Semicon Korea in Seoul on February 7-11, 2022 (booth #A410-1st Floor-Hall A).
