TESCAN GROUP introduces the MIRA XR, an ultra-high-resolution SEM-EDS solution designed for fast, precise materials analysis in academic research and quality control environments.
Designed to bridge the gap between conventional FEG SEMs and ultra-high-resolution (UHR) systems, MIRA XR offers analytical flexibility, ease of use, and streamlined workflows for both industrial and research applications.
Precision, Speed, and Versatility for Industry & Research
MIRA XR is engineered for high-throughput environments, including quality control, metallurgy, battery research, and semiconductor failure analysis, where both speed and imaging accuracy are critical.
A New Balance Between Resolution and Usability
“With MIRA XR, we’ve created a solution optimized for demanding users seeking advanced imaging performance combined with ease of operation,” said Jean-Charles Chen, TESCAN GROUP CEO. “Our customers now have a SEM that delivers resolution at nanoscale, productivity and analytical versatility for multi-user environment.”
“We listened to customer feedback and designed a system that optimizes every step of the workflow. Introducing MIRA XR, featuring MIRA-optimized BrightBeam™ technology for exceptional low-keV imaging performance, with a focus on minimizing time to data. MIRA XR allows operators to focus on their samples, rather than instrument adjustments, ensuring a faster, more seamless path to high-resolution insights,” adds Bruno Janssens, Chief Strategy Officer of TESCAN GROUP.
Key Advantages of MIRA XR:
- High-Speed, High-Resolution Imaging – BrightBeam™ technology achieves sub-nanometer resolution at low accelerating voltages, while Wide Field Optics™ speeds up sample navigation by 40%.
- Optimized Analytical Workflow – Dual Essence™ EDS reduces elemental analysis turnaround by up to 50%.
- Flexible Sample Handling – MultiVac™ mode enables low-vacuum operation for beam-sensitive and outgassing samples.
- Automated and User-Friendly – In-Flight™ Automation simplifies imaging, making high-resolution imaging accessible to all experience levels.
Launch Webinars & Product Demonstrations
To showcase MIRA XR’s capabilities, TESCAN Group has scheduled a series of events and webinar for industry and academia.
Webinar:
Microscopy congresses:
- 24.06.2025 – MMC in Manchaster, United Kingdom
- 27.07.2025 – M&M in Salt Lake CIty, Utah, United States
- 31.08.2025 – MC in Karlsruhe, Germany
