When the Chips Are Down: Leveraging Real-Time Data to Optimize Fabrication Plants

Leveraging refractometers for in-line liquid concentration measurements enables advanced and accurate process control supporting industrial automation.

An Interview with Kistler’s Robert Hillinger

Robert Hillinger, Business Development Manager at Kistler, explains how dynamic force measurement increases process reliability in semiconductor production.

Process Control Needs Are Increasing Across Semiconductor Fabs

To increase yields and tool uptime, there is a growing need in the front-end of the fab to use wireless sensors.