The 2021 IEEE International Reliability Physics Symposium (IRPS), the industry’s premier technical conference for engineers and scientists to present the latest original research in microelectronics reliability, will be held as a virtual conference due to concerns over the global coronavirus (COVID-19) pandemic. The entire Symposium technical program, consisting of more than 100 invited and accepted papers, as well as posters, delivered by leading reliability scientists and engineers from around the world, will be presented online. IRPS registrants will be able to access the presentations online on demand until April 30.
Registration for the virtual IRPS 2021 is now available on the conference website, and other program details will be sent via email to registrants and posted on the IRPS website as they become available.
“As we have done for nearly 60 years, the IRPS management committee and board of directors have developed a premier technical conference program that presents the most advanced research for microelectronics reliability engineers around the world. While we all would have preferred to have a traditional in-person IRPS conference this year, the decision to go with a virtual format was necessary due to the ongoing world health issue of the coronavirus pandemic,” said Robert Kaplar, IRPS 2021 general chair. “However, the virtual platform will enable registrants to fully participate in a comprehensive program, consisting of technical presentations and posters, keynote and invited speakers, the Reliability Year in Review, tutorials, workshops, and exhibits, and to interact with reliability colleagues from around the world.”
The IEEE International Reliability Physics Symposium (IRPS) is the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment. IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability, and to meet and network with reliability colleagues from around the world.